ESAW Speckle Pattern Interferometry (MP-7595)

ESAW Speckle Pattern Interferometry (MP-7595)

Speckle Pattern Interferometry (SPI) determines the difference between two small deformation states of the same inspected object. Speckle-pattern ineterferometry shows a fringe pattern, which can be interpreted as contour lines of the same state of deformation. The distance between two fringes corresponds to half the laser wavelength. Therefore SPI allows sensitive and non-contact detection of defects. This instrument has been developed by ISRO Satellite center, Bangalore for NDT applications with Hollmattric Company. It makes use of speckle pattern interferometry along with CCD imaging techniques and image processing software for studying the static and dynamic conditions of the test objects. Hollmattric company has a technology transfer agreement with ISRO Satellite center for manufacturing and marketing this system with the permission of Hollmarc Company we have given this equipment in our catalogue. The unit consists of opto-mechanical and optical components similar to those used for holography, assembled on a breadboard. He-Ne laser is used as light source. Instead of holographic plates, CCD camera is used for recording fringes.